Strumentazione usata / ricondizionata

 

Strumento Descrizione: quantità Euro
iva escl

nikon eclipse 80i

MICROSCOPIO NIKON ECLIPSE 80i

 Microscopio ottico da ricerca per campo chiaro, contrasto interferenziale e fluorescenza (DAPI, FITC e TRITC, sbarramento selettivo) equipaggiato con camera digitale Nikon DS-5Mc.
Software Lucia incluso.

Specifiche => Eclipse90i-80i.pdf

Galleria fotografica
1 14000,00

sympatech 

Sympatec QUIXEL
Dispersion for laser diffraction
of suspensions and emulsions 0.1 µm - 3500 µm


 Its innovative, tubeless design enables very fast measuring cycles. Even high density particles such as 3 mm ball bearing beads made from stainless steel are safely transported in water through the flow through cell without the need for using special liquids of high viscosity. The wet dispersion process is supported by a built-in ultrasonication unit, which is adjustable by software from 0 to 60 W in 1% steps.
1 6000,00

 

Coulter Counter IIe multisizer for particle number counting and particle size distribution analysis

1 1000,00

 

Particle Sizing Systems Nicomp 380/ZLS Zeta Potential Analyzer with Software 1 1000,00

xrf

Spettometro a fluorescenza raggi X PANalytical PW 2404

RICONDIZIONATO/GARANTITO

PHILLIPS (now, PANAlytical, The Spectris Technology, The Netherlands)
X-Ray tube with Rh target.
X-ray generator : 4 KW with 60 KV, 125 mA (in steps). The generator is solid state based on 'Switch Mode Power Supply' design to respond fast the changes sought in X - Ray
tube power.
1 email
o
telefonare 

Conduttivimetro SevenMulti™ S70

Conductivity meter of the super class Professional measurement * Linear & non-linear temperature correction * Selectable reference temperature (20°C - 25°C) * Procedure for automatic α- coefficient determination


1 600,00

profilometro

Rugosimetro Hommelwerke T2000
The Hommelwerke T2000 profilometer is a highly modern roughness measuring device used for universal measurement of surface roughness in conjunction with a transverse unit (LV-50). Combined with the P2000 documentation unit enables logging of measured results and date alphanumerically and graphically.

Applications: Typically used for measuring surface roughness on machined surfaces such as flat lapping reaming, grinding, horizontal and vertical milling and turning. Technical Specification:     Workpeice size - Application specific     Transverse Unit Range (LV-50) - 60mm     Transverse Unit Accuracy - Guide accuracy 0.2 µm/60 mm     Probe set - TKE 100/17
1 1200,00

microscopio zeiss 

Bellissimo microscopio con telecamera ad alta risoluzione
completo di ottiche come da foto, PC e monitor.
Ha la funzione di microdensitometro.

Tavolo escluso.
1 telefonare

 

Il nostro personale tecnico sarà lieto di rispondere

alle tue domande al numero telefonico

06 9701568

dalle 9:00 alle 13:00 e dalle 15:00 alle 19:00.

 

 

per informazioni o richiesta d'offerta compilate il seguente spazio:

Nome e cognome :

Città :

la vostra richiesta


E-mail per la risposta :